Scanning Transmission Electron Microscopy (STEM)
Definition: A type of microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50--150 kV is scanned across an electron-transparent specimen under vacuum and the intensities of the transmitted electrons are measured.
Source: Royal Society of Chemistry Ref: https://www.rsc.org/publishing/journals/prospect/ontology.asp?id=CMO:0000086&MSID=B926031E
Related terms: Electron Microscopy, Transmission Electron Microscopy